The AD1862 is a monolithic 20-bit digital audio DAC. Each device provides a 20-bit DAC, 20-bit serial-to-parallel input register and voltage reference. The digital portion of the AD1862 is fabricated with CMOS logic elements that are provided by Analog Devices' BiMOS II process. The analog portion of the AD1862 is fabricated with bipolar and MOS devices as well as thin-film resistors.
New design, layout and packaging techniques all combine to produce extremely high performance audio playback. The design of the AD1862 incorporates a digital offset circuit which improves low-level distortion performance. Low stress packaging techniques are used to minimize stress-induced parametric shifts. Stress-sensitive circuit elements are located in die areas which are least affected by packaging stress. Laser-trimming of initial linearity error affords extremely low total harmonic distortion. Output glitch is also small, contributing to the overall high level of performance.
The noise performance of the AD1862 is excellent. When used with the recommended two external noise-reduction capacitors,it achieves 120 dB signal-to-noise ratio.
The serial input port consists of the clock, data and latch enable pins. A serial 20-bit, 2s complement data word is clocked into the DAC, MSB first, by the external data clock. A latch-enable signal transfers the input word from the internal serial input register to the DAC input register. The data clock can function at 17 MHz, allowing 16 * FS operation. The serial input port is compatible with second-generation digital filter chips for consumer audio products such as the NPC SM5813 and SM5818.
The AD1862 operates with ±5 V to ±12 V supplies for the digital power supplies and ±12 V supplies for the analog supplies.The digital and analog supplies can be separated for reduced digital crosstalk. Separ
VL to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to +13.2 V
VL to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . VS to 0 V
VS to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to +13.2 V
VS to AGND . . . . . . . . . . . . . . . . . . . . . . . . 13.2 to 0 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . 0.3 to +0.3 V
Digital Inputs to DGND . . . . . . . . . . . . . . . . . . . .0.3 to VL
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . +300°C, 10 sec
Storage Temperature . . . . . . . . . . . . . 60°C to +100°C
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Required Field 
